Stop by Booth 707 for our latest Failure Analysis Solutions!
Hitachi High Technologies America provides technologically advanced imaging solutions to meet the complex challenges of today's busy research and industrial labs. Our expanding and innovative product portfolio includes SEM, TEM, STEM, FIB, Ion Milling instrumentation, AFM and SPM, Atmospheric and Table Top SEM, and sample prep solutions. Stop by the Hitachi Booth 415 at ISTFA for a demonstration of the FlexSEM 1000, full-sized SEM imaging in a compact package, the TM4000, the latest addition to our line of table top microscopes, the AFM 5100N, and the ArBlade 5000, the fastest Ion Milling Sample prep tool available in today's market. Come visit us and see how Hitachi can provide your failure analysis solution.
Brands: The Hitachi TM4000 table top SEM. Hitachi's FlexSEM 1000, Hitachi;s ArBlade 5000 and the Hitachi AFM 5100N will all be available for demonstration at ISTFA Booth 707.