JEOL is the global leader in ultra-high resolution electron microscopes and tools for failure analysis, quality control, product inspection and semiconductor/nanotech R&D. SEMs and TEMs providing high throughput analysis, nanoscale/atomic imaging, and high-speed mapping are available. Learn about our new solutions including correlative microscopy, surface analyzers, specimen prep and analytical equipment to support your requirements.
Brands: SEM, TEM, FE SEM,