Visit JIACO Instruments to discuss damage free decapsulation
JIACO Instruments Microwave Induced Plasma (MIP) decapsulation is the new standard for reliable Failure Analysis and Quality Control. The fully automated process is highly selective; critical failure sites in advanced packages (e.g. SiP, WLCSP, 2.5D, 3D) are retained without process-induced damage to challenging materials and structures, such as Ag and Cu bond wire, GaAs, Cu RDL, BOAC, SAW/BAW filters.
The JIACO Instruments MIP system has been in the market since mid-2016 and is now in use by many renown global companies for reliable failure analysis and quality control. At ISTFA 2022 JIACO Instruments will be:
- Present in the 'Tools of the Trade' tour where you will hear how you can use MIP to expose and preserve the original failure sites for critical failure analysis
- At booth 521 during the exhibition
We look forward to speaking with you at ISTFA 2022!
Brands: JIACO Instruments
Microwave Induced Plasma (MIP)
Oxygen-only atmospheric plasma
Preservation of all bond wire materials
Artifact-free decapsulation
Automated decapsulation
Localized decapsulation