SEMICAPS designs, manufactures and markets innovation fault localization microscopes for semiconductor companies. Customers use these equipment for their design-debug and yield analysis work. These world leading instruments help users to, efficiently and quickly, ramp up the yield of their latest chip design by analyzing and locating faults in their engineering samples and early production runs.
Our products include the:
a. Laser Timing Probe (LTP) - An instrument which allows the waveform at a particular node inside a semiconductor device or IC to be measured using a laser as a probe;
b. Scanning Optical Microscope (SOM) System - A multi-laser scanning optical microscope system for the active localization of integrated circuit defects using static power alteration and dynamic tester-based techniques;
c. Photon Emission Microscope (PEM) System - A highly sensitive passive fault localization system for the localization of integrated circuit defects using panchromatic imaging and spectroscopy.