Oxford Instruments

Concord,  MA 
United States
  • Booth: 712

Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterization and sample manipulation at the nanometer scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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