Quantum Focus Instruments
QFI played a pioneering role in the fields of Failure Analysis Microscopy and Temperature Measurement Microscopy through our predecessor companies, and we have continued to play a central role as system innovator and application developer through many stages of semiconductor design evolution. Our modular QuantumScope™ FA microscope systems offer emmi™ photoemission, XIVA™ LSIM (Laser Signal Injection) and Thermal-HS MWIR hot spot detection for rapid and repeatable localization of semiconductor device defects. We view these techniques as complementary in nature, with a multi-technique QuantumScope™ generally leading to a clearer story about the defect conditions under investigation than could be achieved with any single technique FA microscope. Our true temperature measurement techniques include MWIR (InfraScope™) and thermoreflectance (T°Imager™). True temperature measurement is concern for a variety of engineering groups (i.e. Reliability, Quality, Packaging, MEMs, Microwave, and RF). QFI microscopes are broadly known for flexibility, sensitivity, accuracy, ease-of-use, robust design, and a very attractive price/performance ratio.
Brands: QuantumScope™ FA Microscopes, InfraScope™ Temperature Measurement Microscopes, emmi™, XIVA™ LSIM, Thermal-HS